UB - University at Buffalo
  
Electrical Engineering


 

James J. Whalen

Publications

1. Whalen, James J. NARTE EMC credentials certification examination [Conference Paper] IEEE International Symposium on Electromagnetic Compatibility. Publ by IEEE, IEEE Service Center, Piscataway, NJ, USA,(IEEE cat n 93CH3310-0). 1993. p 5-9

2. Ghadamabadi, Hamid. Whalen, James J. Parasitic capacitances can cause demodulation RFI to differ in inverting and noninverting operational amplifier circuits. [Conference Paper] 91 IEEE Int Symp Electromagn Compat IEEE International Symposium on Electromagnetic Compatibility. Publ by IEEE, IEEE Service Center, Piscataway, NJ, USA (IEEE cat n 91CH3044-5). p 151-156

3. Ghadamabadi, Hamid. Whalen, James J. Coslick, R. Hung, C. Johnson, T. Sitzman, W. Stevens, J. Comparison of demodulation RFI in inverting operational amplifier circuits of the same gain with different input and feedback resistor values. [Conference Paper] IEEE International Symposium on Electromagnetic Compatibility. Publ by IEEE, IEEE Service Center, Piscataway, NJ, USA (IEEE cat n 90CH2903-3). p 145-152

 

 

HIGHLIGHT

nanobridge_mitin.gif

Fundamental research can be a starting point for device simulations--such as novel nanosensors with ultimate quantum sensitivity like the Hot-Electron Direct Detector (HEDD) for submillimeter cosmic radiation shown here.

THE FACES OF EE

Vidhya Seran
Ph.D. candidate (Video Communication)

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