Research Activities: High-Resolution
X-ray Diffracton Laboratory (H.R.X.L)

This laboratory, located in 218 Bonner Hall, has two x-ray diffractometers: Huber 4-Circle Diffractometer with Rigaku RU-200 Rotating Anode Generator (15 kW), and a Double-Crystal Diffractometer from Bede with a sealed-tube x-raysource. The double-crystal diffractometer is used mainly for semiconductor analysis. The 4-circle diffractometer is used for thin film analysis and for the triple-crystal reciprocal-space mapping of diffraction intensity.

The laboratory is becoming equipped with networked data acquisition/simulation and user information system. The networked data acquisition software is being developed in Java and C++ programming languages. The data analysis software for the x-ray rocking curves and reciprocal space maps is being converted to Java so that users may use this program from their local machine on a data stored in the Server machine of this laboratory.

Part of the service facility of the laboratory is a collection of educational Java applet programs in semiconductor materials and devices concepts.