9. “Charged quantum dots
for high efficiency photovoltaics and IR sensing,” A. Sergeev, N.
Vagidov, V. Mitin, and K. Sablon, in Future Trends in Microelectronics,
editors S. Luryi, J. Xu, and A. Zaslavsky, Wiley-IEEE Press, 2013,
8. “Concepts of
terahertz and infrared photodiodes and phototransistors based on graphene
structures,” V. Ryzhii, N. Ryabova, M. Ryzhii, V. Mitin, and T.
Otsuji, Chapter 6.2, pp. 197-205, in
Frontier Techno Series No.17, “Application of state-of-the-art
technology and the spread of graphene,” 2012, SBN978-4-902410-24-2.
7. “Quantum dots with built-in charge
for enhancing quantum dot solar cells and infrared photodetectors,”
K. A. Sablon, V. Mitin, J. W. Little, A. Sergeev, and N. Vagidov, Chapter
13 in book “ Quantum Dot Devices, Lecture Notes in Nanoscale Science
and Technology”, ed. Zh. Wang, Springer, New York, 2012, pp. 297
6. “Terahertz and infrared photodetectors based on multiple
graphene layer and nanoribbon structures,” V. Ryzhii, N. Ryabova,
M. Ryzhii, N.V. Baryshnikov, V.E. Karasik, V. Mitin, and T. Otsuji,
Optoelectronics Review, Vol 20, No.1, pp. 15-25, 2012.
modeling of electron kinetics in room temperature quantum-dot
photodetectors,” V. Mitin, A. Sergeev, L-H. Chien, and N.
Vagidov, in Large-Scale Scientific Computing, eds. I. Lirkov and S.
Margenov, Spinger Berlin / Heidelberg, 2010, pp. 403-410.
“Quantum-dot photodetectors: In search of optimal design for
room-temperature operation,” V. Mitin, L. Chien, N. Vagidov, and A.
Sergeev, in “Future Trends in Microelectronics: From Nanophotonics to Sensors and Energy”, Edited by S. Luryi, J. Xu, A. Zaslavsky, John Wiley & Sons,
Devices: Concepts and Characteristics,” V. Ryzhii, M. Ryzhii, A. Satou, T Otsuji, V. Mitin, F.T. Vasko, A.A. Dubiniv, V.Y Aleshkin, and M. Shur,
in “Future Trends in Microelectronics: From Nanophotonics to Sensors and Energy”, Edited by S. Luryi, J. Xu, A. Zaslavsky, John Wiley & Sons,
Noise in Semiconductors," V. Mitin, L. Reggiani, and L. Varani,
Invited Chapter 2 in a book “Noise and Fluctuation Control in
Electronic Devices,” American Scientific Publishers, edited by A.
Balandin, 2002, pp. 11- 29.
1. "Recombination and Ionization Processes at Impurity Centers in Hot
Electron Semiconductor Transport," L. Reggiani and V. Mitin, La
Rivista del Nuovo Cimento, 1989, Vol. 12, the whole issue No. 11, pp. 1-90.