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Chu Ryang Wie
Professor
PhD, California Institute of Technology
Research Interests
- Semiconductor devices - device reliability under voltage/current
stress, radiation (gamma-ray, proton, x-ray) effect
- X-ray analysis of semiconductor materials such as metamorphic
buffer materials using reciprocal space mapping, and other x-ray
methods
- Semiconductor nanodevice visual simulation
Publications
Mailing Address
215C Bonner Hall
Department of Electrical Engineering
University at Buffalo, the State University of New York
Buffalo, NY 14260-1920
Phone: (716) 645-3115 ext. 1211
Fax: (716) 645-3656
E-mail:
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