Multidisciplinary Nano and Microsystems Laboratory

RF Probe Station

The probe stations (Jr-2745) are high value personal and flexible microprobing

environments for engineers and scientists. They are useful in electrical test for evaluation and prototype quantities of semiconductor devices and microwave assemblies. Test engineering of production probe card for new products can also be accomplished by using the probe card adapter. The following matrix can be used to help select the appropriate configuration for specific applications.